https://www.usa.gov/copyrighted-government-workshttps://www.rawpixel.com/image/3325548Edit ImageSaveSaveEditCropCustom TextA beamline scientist at Argonne National Laboratory's Advanced Photo Source, aligns a sample of a computer chip in the nanodiffractometer, which allows for structural characterization of individual nanomaterials. Original public domain image from FlickrMorePublic DomainFree CCO U.S. Government image for Personal and Business useInfoView CC0 LicenseEditorial use only JPEGLarge 3000 x 2117 px | 300 dpiFree DownloadA beamline scientist at Argonne National Laboratory's Advanced Photo Source, aligns a sample of a computer chip in the nanodiffractometer, which allows for structural characterization of individual nanomaterials. Original public domain image from FlickrMore